We are excited to extend an exclusive invitation to join YIC TECHNOLOGIES for a special technical session and online demonstration. This event will delve into crucial topics such as "Introduction to Near Field Scanning Solution" and "Near Field Scanning Solutions."

 

Expect to gain invaluable insights into groundbreaking technology that is reshaping the landscape of the industry. Don't miss this opportunity to delve into the complexities of EMC/EMI and experience its real-world applications.